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Thin film

 
 
 
           
    Liquid crystal bilayers (3.3nm)  Liquid crystal bilayers (3.3nm)  AFM scan on Liquid Crystal precursor film  Amphiphilic molecules self-organisation (5.5nm)  Amphiphilic molecules self-organisation (5.5nm)    
 
   
   
     
 

Sarfus: Characterization of adhesive nanometric layer on SiO2 surface
In this work, two well-known protective adhesives designed for microelectronic applications have been studied with the Sarfus technique. Theses adhesives are described as providing clean removal during masking operations but the presence of nanometric organic layers is shown.

Study of PDMS and 8CB prewetting films by Sarfus
The prewetting films of a methyl-terminated PDMS droplet and 8 CB liquid crystal are characterized by SARFUS. Thin layers of 0.7 and 3.3 nm are measured on both systems, respectively.

SARFUS: Study of dibloc copolymer microphase structuration
In the experiment discussed here the thin layer of diblock copolymer is formed by spin-coating from solution. The initial diblock copolymer is quite disorganized, meaning that the material is not microphase separated and so the PS and PMMA segments are intimately mixed. When the dibloc copolymer is heated, the diblock will slowly organize. Sarfus was used to investigate the surface structure of the diblock copolymer. 

SARFUS: Study of layer-by-layer polyelectrolyte deposition

In recent years, intensive studies have been carried out on the preparation of multilayer systems by the so-called layer-by-layer method (LbL)1. This technique based on the successive deposition of very thin layers makes it possible to produce materials with complex properties. In typical processes, two water-soluble polyelectrolytes possessing groups with opposite charges are alternatively deposited by electrostatic attraction on flat surfaces such as glass and silicon substrates.

 
     
    8CB wetting & evaporation      
 
     
 
  "Fingering Instabilities in Dewetting Nanofluids"
E. Pauliac-Vaujour, A. Stannard, C. P. Martin, M. O. Blunt, I. Notingher, P. J. Moriarty, I. Vancea and U. Thiele
Phys. Rev. Lett. 100, 176102 (2008)
http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=PRLTAO000100000017176102000001&idtype=cvips&gifs=yes
 
 
 
       
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