Combination with other techniques

Synergy with existing equipments.
Our technology can be integrated in existing analysis equipment (AFM, Profilometer, Ellipsometer, RAMAN, XPS, SIMS...)

1. to add new functionalities (optical image, thickness measurement, kinetic study…)
2. for sample pre-localization to save time and consumables (AFM tips…)

Two ways are possible depending on the ability of your equipment to be coupled with an optical system
(Sarfus configuration).

Solution 1 :
Your equipment integrates or can integrate an optical system (in Sarfus configuration).

1 >>		Put your sample on a Surf

2 >>		Localize your sample with the optical microscope

3 >>		Analyse your sample with your equipment

Localisation of nanometric
structure before AFM analysis

Solution 2 :
Your equipment does not integrate or can not integrate an optical system.

1 >>		Put your sample on a localization surf (30nm-structures)

2 >>		Localize and note the x;y coordinates of your sample observed with the optical microscope

3 >>		Put the localization surf on the stage of your equipment

4 >>		The 30nm-structures are visible with a standard camera. Place the AFM/profilometer tip, laser/ion/ beam… at the x;y coordinates previously noted.

5 >>		Characterize your sample

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