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Sarfus for pre-localization |
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Sarfus for pre-localization |
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| Collaboration: P. Royer, LNIO, Troyes (France) |
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| |  | | Easy tip positionning | | | | | Tips and time saving | | | | |
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| |  | | SiO2 Surf | | |  | | Your Optical Microscope : upright, reflected light (BF OK)
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AFM in combination with SARFUS is elaborated in order to allow a direct pre-visualization of nano-objects or nano-structures.
In this study, an AFM scan is performed on a calibration standard provided by Nanolane. The sample is put on the AFM stage and thanks to the microscope, a rapid localization of the structure is possible.
(Scale bar: 100µm) |
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