 We wish to take advantage of this opportunity to give our thanks to those of you who have bought into our SURFs website philosophy by learning there what SURFs are all about and even conveniently order their supplies from our online store to carry out SEEC with their own kit. The Nanolane team SURFs: all-around substrates in
AFM, RAMAN, IR, XPS, SIMS... studies In addition to their traditional use as the new generation of microscope slides for optical sample characterization down to the nanometer scale, SURFs can also be employed as all-around substrates in AFM, RAMAN, IR, XPS, SIMS... studies for ROI (Region Of Interest) localisation and sample integrity control. These abilities are illustrated through recent work done on carbon nanotubes and graphene oxide sheets in collaboration with HORIBA Jobin-Yvon. ROI LOCALISATION   | RAMAN map of SWCNT rods obtained using a DCLS algorithm (reference spectra from the RBM region). The colours correspond to different rod diameters. | SAMPLE INTEGRITY CONTROL  | Graphene oxide flakes are highly sensitive to laser power and can be damaged by laser exposure during RAMAN analysis. | SEEC helps tune settings for RAMAN spectroscopy to actually be non-destructive and get accurate spectra. |   |  | | Thanks to A.Pénicaud (CRPP Bordeaux, France) and J.Vermant / L.Imperiali d'Afflitto (KUL Leuven, Belgium) for providing us the samples. | |
