Sarfus visualization is based on the perfect control of the reflection properties of polarized light on a Surf, which leads to increase the axial sensitivity of the optical microscope by a factor of around 100 without reducing its lateral resolution.
The measurement of thin film optical thickness, as well as the 3D representation, is made possible by the colorimetric study of the Sarfus images.
Even if Sarfus technology appears as a novel and self-contained nanotechnology tool, its combination with other techniques (like AFM or RAMAN spectroscopy) leads to a real synergy.
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