Nanotechnology company Nanolane

To boost YOUR Reflected Light Optical Microscope

(Operating various illumination techniques such as Bright Field, Polarization, DIC, RICM)

 

To get a dedicated instrument

(Taking care of everything from image acquisition to measurement with ultimate detection limit)

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Imaging Solution:
SURFs

Use one of several kinds of 'SURFs' as microscope slides and visualize your sample with nanometric sensitivity!
 
 

Online catalog

SEEC SURFs box

Measurement Solution:
SARFUS Mapping Lite

Not only image in 2D but also map in 3D the optical thickness of your film-like sample from its colored image thanks to our proprietary conversion software plus our calibration standard!

Download specs

SARFUS Mapping Lite
 

Stand-alone Solution:
SARFUS Mapping Station

The perfect instrument to implement SEEC (imaging AND mapping in air or in water!)

Download specs

SARFUS mapping Station

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