| | You are interested in visualization or detection of isolated objects or thin layers having nanometric dimensions. We can provide you with an economical package including:
Surfs / Optical Microscope / Acquisition system | | | | | Advantages | >> | | Extreme sensitivity (<1nm) | >> | | User Friendly | >> | | Direct acquisition (no scanning) | >> | | Observation area from 80 µm to few mm | | >> | | Lateral resolution : 350 nm | | >> | | Real-time visualization | >> | | No labelling, no sample destruction |
|
| | This complete solution allows to visualize in real-time molecular thin films with a xy resolution of 0.35µm, and to perform thickness measurement with repeatability better than 3Å. You will access to 3D representations of the samples and to information such as surface topology, roughness, profile section… The package includes :
Surfs / Optical Microscope / Plug-In Sarfus 3D (Acquisition sytem + calibration standard + software) | | | | | | Advantages | >> | | Direct 3D representation | >> | | Repeatability < 3Å | >> | | Access to roughness, profile section, topology characteristics... |
|
| |
