| What it's all about ? Optical visualisation and measurement with an Optical microcospe down to few nm (z-axis) Sarfus visualization is based on the perfect control of the reflection properties of polarized light on a Surf, which leads to increase the axial sensitivity of the optical microscope by a factor of around 100 without reducing its lateral resolution. The measurement of thin film optical thickness, as well as the 3D representation, is made possible by the colorimetric study of the Sarfus images. What can I use it for ? Thin film, Surface treatment, Nanotube, Nanowire, Self-organisation, Biochip, Pattern, Langmuir Blodgett, µContact Printing, Cristallization, Nanoparticle, Liquid Cristal Comparison with other techniques - why it's compatible- not competitive ? Our technology can be integrated in existing analysis equipment (AFM, Profilometer, Ellipsometer, RAMAN, XPS, SIMS...) 1. to add new functionalities (optical image, thickness measurement, kinetic study?) & 2. for sample pre-localization to save time and consumables (AFM tips?). Sarfus is the only technique which gives the possibility to look at your sample directly with your eyes. How do I get my hands on one (for a demo) ? Ask for a Skype video demo or Call back here. How much does it cost ? Price list are available on request. When can I have it ? Within 2 months in your Lab ready to use. | 
