Nanotechnology company Nanolane
 
26-02-2009

Graphene sheet thickness measured with SARFUS

 
 
  A recent article in Journal of American Chemical Society from researchers at the University of Bordeaux (France) shows graphene sheets visualized and measured with the SARFUS optical technique [1]

 
   
  This characterization was done in the framework of negatively charged graphene layers preparation from a graphite intercalation compound by dissolution in N-methylpyrrolidone. The dissolution is done spontaneously without sonication and yields to stable, air-sensitive solutions of laterally extended atom-thick graphene sheets and ribbons with dimensions over tens of micrometers. Graphene sheets characterization by Sarfus yields height of 0.3nm, in good accordance with AFM analyses on mica which give the actual height of graphene (ca. 0.4nm).

[1] C.Valles et al, J. Am. Chem. Soc., 2008, 130 (47), pp 15802–15804
 
   
   
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