Nanotechnology company Nanolane
 
 

Crystallization

 
 
 
         
    PEO crystallization (4nm)  Crystallisation of a 5nm-film  In-situ monitoring of annealed single copolymer crystals (30°C)  In-situ monitoring of annealed single copolymer crystals (55°C)    
 
   
   
     
 

In-situ monitoring of annealed single copolymer crystals (66°C)

 
Collaboration: Houssam Hamie and Dimitri Ivanov, Institut de Chimie des Surfaces et Interfaces, Mulhouse, France
 
   
 

  In-situ monitoring


Optical thickness measurement

  Large Field of View
     
 
 
In-situ monitoring of annealed single copolymer crystals (66°C)
 
 
       
 

  SiO2 Surf


Hot Plate

  Your Optical Microscope : upright, reflected light (BF OK)
     
   
     
 
In-situ monitoring of single crystals of PS-b-PEO copolymer were analysed during annealing between 30 and 66°C.
The optical thickness determined by AFM at 30°C is 14nm.

Scale bar: 10µm
 
     
       
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