Thin film

Liquid crystal bilayer by nanotechnology Nanolane

AFM scan on Liquid Crystal precursor film by Nanolane

Liquid crystal bilayers (3.3nm)

AFM scan on Liquid Crystal precursor film

Amphiphilic molecules self-organisation (5.5nm)

Adhesive organic residue on SiO2 surface (1.2nm)

Collaboration:


		Extreme sensitivity (<1 nm)

		Ability to analyse soft materials

		Direct and fast analysis

Adhesive organic residue on SiO2 surface (1.2nm)


		SiO2 Surf

		Sarfus Mapping Station
OR,
		Your Optical Microscope + Sarfus Mapping Lite

A commercial protective adhesive widely used in the microelectronic field and considered as non-surface contaminant is studied. Sarfus image on SiO2 surface shows that a nanometric layer is present on the part of the surface where the adhesive was stuck (left side). The mean optical thickness of the layer is about 1.2nm.

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