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Nanolane will participate as invited speaker at the next â??2nd Dimensional Metrology Meetingâ?? organised by the LNE on 27 Nov. 2007 (Paris) | ||||||||
 The LNE (Laboratoire National de Métrologie et d’Essais) will organized the ‘2nd Dimensional Metrology Meeting’ on the 27th Nov (Paris) with the will to:- bring answers to the expressed needs for the improvement in the control of nanometric measurement; - exchange on research and development projects with experts; - inform you on the evolution of standardization works. Three major topics are retained: - surface properties measurement - thickness measurement - small dimensions measurement Further information on the event can be found on the website: http://www.lne.eu/index-en.asp |
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